Dpit: Distribution Pitting

Compares distributions with one another in terms of their fit to each sample in a dataset that contains multiple samples, as described in Joo, Aguinis, and Bradley (in press). Users can examine the fit of seven distributions per sample: pure power law, lognormal, exponential, power law with an exponential cutoff, normal, Poisson, and Weibull. Automation features allow the user to compare all distributions for all samples with a single command line, which creates a separate row containing results for each sample until the entire dataset has been analyzed.

Version:	1.0
Depends:	R (≥ 3.1.1)
Imports:	VGAM, gsl, moments, utils, fitdistrplus
Published:	2017-03-03
DOI:	10.32614/CRAN.package.Dpit
Author:	Harry Joo [aut, cre], Herman Aguinis [aut, dtc], Kyle J. Bradley [aut], Takuya Noguchi [ctb]
Maintainer:	Harry Joo <harryjoo19 at gmail.com>
License:	GPL-2 | GPL-3 [expanded from: GPL (≥ 2)]
NeedsCompilation:	no
Citation:	Dpit citation info
Materials:	README
CRAN checks:	Dpit results

Documentation:

Reference manual:

Dpit.pdf

Downloads:

Package source:	Dpit_1.0.tar.gz
Windows binaries:	r-devel: Dpit_1.0.zip, r-release: Dpit_1.0.zip, r-oldrel: Dpit_1.0.zip
macOS binaries:	r-release (arm64): Dpit_1.0.tgz, r-oldrel (arm64): Dpit_1.0.tgz, r-release (x86_64): Dpit_1.0.tgz, r-oldrel (x86_64): Dpit_1.0.tgz

Linking:

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